XQ18V04 Datasheet, PDF (12/17 Pages) Xilinx, Inc – QPro XQ18V04 (XQR18V04) QML In-System Programmable Configuration PROMs

QPro XQ18V04 (XQR18V04) QML In-System Programmable Configuration PROMs
R
Absolute Maximum Ratings^(1,2)
Symbol
Description
Value
Units
V_CC
V_IN
V_TS
T_STG
T_J
Supply voltage relative to GND
Input voltage with respect to GND
Voltage applied to High-Z output
Storage temperature (ambient)
Junction temperature
Ceramic
Plastic
–0.5 to +4.0
V
–0.5 to +5.5
V
–0.5 to +5.5
V
–65 to +150
°C
+150
°C
+125
°C
Notes:
1. Maximum DC undershoot below GND must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During transitions, the
device pins may undershoot to –2.0V or overshoot to +7.0V, provided this over- or undershoot lasts less then 10 ns and with the
forcing current being limited to 200 mA.
2. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
Recommended Operating Conditions
Symbol
V_CCINT
V_CCO
Parameter
Internal voltage supply (T_C = –55°C to +125°C)
Internal voltage supply (T_J = –55°C to +125°C)
Supply voltage for output drivers for 3.3V operation
Supply voltage for output drivers for 2.5V operation
V_IL
Low-level input voltage
V_IH
High-level input voltage
V_O
Output voltage
Quality and Reliability Characteristics
Ceramic
Plastic
Min
Max Units
3.0
3.6
V
3.0
3.6
V
3.0
3.6
V
2.3
2.7
V
0
0.8
V
2.0
5.5
V
0
V_CCO
V
Symbol
Description
T_DR
N_PE
V_ESD
Data retention
Program/erase cycles (Endurance)
Electrostatic discharge (ESD)
Radiation Tolerances for XQR18V04
Min
10
2,000
2,000
Max
-
-
-
Units
Years
Cycles
Volts
Symbol
TID
SEL
SEU
Description
Total Ionizing Dose
Single Event Latch-Up
(No Latch-Up observed for LET > 120 MeV-mg/cm²)
Static Memory Cell Saturation Bit Cross-Section
(No Upset observed for LET > 120 MeV-mg/cm²)
Min
Max
Units
-
40
krad(Si)
-
0
cm²
-
0
cm²
12
www.xilinx.com
DS082 (v1.2) November 5, 2001
1-800-255-7778
Preliminary Product Specification