THS4551 Datasheet, PDF (5/70 Pages) Texas Instruments – Low-Noise, Precision, 150-MHz, Fully Differential Amplifier

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7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
V_S+
Single-supply positive voltage
T_A
Ambient temperature
THS4551
SBOS778A – APRIL 2016 – REVISED AUGUST 2016
MIN
NOM
MAX UNIT
2.7
5
5.4
V
–40
25
125
°C
7.4 Thermal Information
THERMAL METRIC⁽¹⁾
RGT ⁽²⁾
(VQFN)
THS4551
RUN
(WQFN)
DGK
(VSSOP)
UNIT
16 PINS
10 PINS
8 PINS
R_θJA
R_θJC(top)
R_θJB
ψ_JT
ψ_JB
R_θJC(bot)
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
54
142
185
°C/W
72
78
76
°C/W
28
97
106
°C/W
3.2
9.7
13
°C/W
28
97
105
°C/W
12
N/A
N/A
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2) Thermal impedance for RGT reported with backside thermal pad soldered to heat spreading plane.
7.5 Electrical Characteristics: (V_S+) – (V_S–) = 5 V
at T_A ≈ 25°C, VOCM pin = open, R_F = 1 kΩ, R_L = 1 kΩ, V_OUT = 2 V_PP, 50-Ω input match, G = 1 V/V, PD = V_S+, single-ended
input, differential output, and input and output referenced to default midsupply for ac-coupled tests (unless otherwise noted);
see Figure 61 for a gain of 1-V/V test circuit
PARAMETER
TEST CONDITIONS
TEST
MIN
TYP
MAX UNIT _LEVEL(1)
AC PERFORMANCE
SSBW
GBP
LSBW
SR
t_R, t_F
t_SETTLE
HD2
HD3
Small-signal bandwidth
Gain-bandwidth product
Large-signal bandwidth
Bandwidth for 0.1-dB flatness
Slew rate⁽²⁾
Rise and fall time
Settling time
Overshoot and undershoot
Second-order harmonic distortion
Third-order harmonic distortion
Input voltage noise
V_OUT = 20 mV_PP, G = 1, peaking (< 1.0 dB)
V_OUT = 20 mV_PP, G = 2
V_OUT = 20 mV_PP, G = 10
V_OUT = 20 mV_PP, G = 100
V_OUT = 2 V_PP, G = 1
V_OUT = 2 V_PP, G = 1
V_OUT = 4 V_PP, full-power bandwidth (FPBW),
R_L = 1 kΩ
V_OUT = 0.5-V step, G = 1, input t_R = 2 ns
To 0.1%, V_OUT = 0.5-V step, input t_R = 2 ns, G = 1
To 0.01%,V_OUT = 0.5-V step, input t_R = 2 ns, G = 1
V_OUT = 0.5-V step G = 1, input t_R = 2 ns
f = 100 kHz, V_OUT = 2 V_PP, G = 1, R_L = 1 kΩ
f = 100 kHz, V_OUT = 8 V_PP, G = 1, R_L = 1 kΩ
f = 100 kHz, V_OUT = 2 V_PP, G = 1, R_L = 1 kΩ
f = 100 kHz, V_OUT = 8 V_PP, G = 1, R_L = 1 kΩ
f > 500 Hz, 1/f < 150 Hz
150
75
15
135
37
15
220
6
30
50
8%
–128
–124
–139
–131
3.3
C
MHz
C
C
MHz
C
MHz
C
MHz
C
V/µs
C
ns
C
C
ns
C
C
C
dBc
C
C
dBc
C
nV/√Hz
C
Input current noise
f > 20 kHz, 1/f <10 kHz
0.5
pA/√Hz
C
Overdrive recovery time
G = 2, 2X output overdrive, dc coupled
50
ns
C
Closed-loop output impedance
f = 100 kHz (differential), G = 1
0.02
Ω
C
(1) Test levels (all values set by characterization and simulation): (A) 100% tested at T_A ≈ 25°C. (B) Not tested in production; limits set by
characterization and simulation. (C) Typical value only for information.
(2) This slew rate is the average of the rising and falling time estimated from the large-signal bandwidth as: (V_PP / √2) × 2π × f_–3dB.
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