TLC5951 Datasheet, PDF (2/46 Pages) Texas Instruments – 24-Channel, 12-Bit PWM LED Driver with 7-Bit Dot Correction and 3-Group, 8-Bit Global Brightness Control

TLC5951
SBVS127B – MARCH 2009 – REVISED DECEMBER 2009
www.ti.com
DESCRIPTION (CONTINUED)
GS, DC, and BC data are accessible via a serial interface port. DC and BC can be programmed via a dedicated
serial interface port.
The TLC5951 has three error detection circuits for LED open detection (LOD), LED short detection (LSD), and
thermal error flag (TEF). LOD detects a broken or disconnected LED while LSD detects a shorted LED. TEF
indicates an over-temperature condition.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Table 1. ORDERING INFORMATION⁽¹⁾
PRODUCT
TLC5951
TLC5951
PACKAGE-LEAD
HTSSOP-38 PowerPAD™
6 mm × 6 mm QFN-40
ORDERING NUMBER
TLC5951DAPR
TLC5951DAP
TLC5951RHAR
TLC5951RHAT
TRANSPORT MEDIA,
QUANTITY
Tape and Reel, 2000
Tube, 40
Tape and Reel, 2500
Tape and Reel, 250
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS^{(1) (2)}
Over operating free-air temperature range, unless otherwise noted.
PARAMETER
V_CC
Supply voltage
I_OUT
Output current (dc)
V_IN
Input voltage range
VCC
OUTR0 to R7, OUTG0 to G7, OUTB0 to B7
GSSIN, GSSCK, GSLAT, GSCKR, GSCKG,
GSCKB, DCSIN, DCSCK, XBLNK, IREF
V_OUT Output voltage range
GSSOUT, DCSOUT
OUTR0 to 7, OUTG0 to 7, OUTB0 to 7
T_J(max)
T_STG
Operation junction temperature
Storage temperature
ESD rating
Human body model (HBM)
Charged device model (CDM)
TLC5951
–0.3 to +6.0
50
–0.3 to V_CC + 0.3
–0.3 to V_CC + 0.3
–0.3 to +16
+150
–55 to +150
2000
500
UNIT
V
mA
V
V
V
°C
°C
V
V
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
2
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