DRV2510-Q1 Datasheet, PDF (10/32 Pages) Texas Instruments – DRV2510-Q1 3-A Automotive Haptic Driver for Solenoids and Voice Coils with Integrated Diagnostics

DRV2510-Q1
SLOS919A – JUNE 2016 – REVISED JUNE 2016
FAULT
Over-current
Table 2. Fault Reporting Table
TRIGGERING CONDITION
INTZ
Output short or short to VDD or GND
pulled low
Over-temperature
Under-voltage
Over-voltage
T_j > 150 ºC
VDD < 4 V
VDD > 21 V
pulled low
pulled low
pulled low
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ACTION
output in high impedance.
I² updated.
output in high impedance.
Recovery is automatic
once the temperature
returns to a safe level.
output in high impedance.
I² reset.
output in high impedance.
I² updated.
7.3.4.1 Diagnostics
The device incorporates load diagnostic circuitry designed for detecting and determining the status of output
connections. The device supports the following diagnostics:
• Short to GND
• Short to VDD
• Short across load
• Open load
The device reports the presence of any of the short or open conditions to the system via I²C register read.
1. Load Diagnostics—The load diagnostic function runs on de-assertion of EN or when the device is in a fault
state (dc detect, overcurrent, overvoltage, undervoltage, and overtemperature). During this test, the outputs
are in a Hi-Z state. The device determines whether the output is a short to GND, short to VDD, open load, or
shorted load. The load diagnostic biases the output, which therefore requires limiting the capacitance value
for proper functioning. The load diagnostic test takes approximately 229 ms to run. Note that the check
phase repeats up to five times if a fault is present or a large capacitor to GND is present on the output. On
detection of an open load, the output still operates. On detection of any other fault condition, the output goes
into a Hi-Z state, and the device checks the load continuously until removal of the fault condition. After
detection of a normal output condition, the output starts. The load diagnostics run after every other
overvoltage (OV) event. The load diagnostic for open load only has I²C reporting. All other faults have I²C
and INTZ pin assertion.
The device performs load diagnostic tests as shown in Figure 6.
Figure 7 illustrates how the diagnostics determine the load based on output conditions.
Discharge
(75 ms)
Ramp Up
(52 ms)
Check
(50 ms)
Ramp Down
(52 ms)
Figure 6. Load Diagnostics Sequence of Events
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