MSP430F2618-EP Datasheet, PDF (7/92 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

TERMINAL
NAME
NO.
P8.0
B10
P8.1
A10
P8.2
D9
P8.3
A9
P8.4
B9
P8.5
B8
P8.6/XT2OUT
A8
P8.7/XT2IN
A7
XT2OUT
XT2IN
RST/NMI
B5
TCK
TDI/TCLK
TDO/TDI
TMS
Ve_REF+/DAC0
V_REF+
V_REF--/Ve_REF--
XIN
XOUT
Reserved
A5
A6
B7
B6
F2
E2
G1
E1
F1
L2, E4
F4, G4
H4, D5
E5, F5
G5, H5
J5, D6
E6, H6
J6, D7
E7, H7
J7, D8
E8, F8
G8, H8
J8, E9
F9, G9
H9, B11
L11
MSP430F2618- EP
MIXED SIGNAL MICROCONTROLLER
Terminal Functions (Continued)
SLAS632 -- DECEMBER 2008
I/O
DESCRIPTION
I/O General-purpose digital I/O pin
I/O General-purpose digital I/O pin
I/O General-purpose digital I/O pin
I/O General-purpose digital I/O pin
I/O General-purpose digital I/O pin
I/O General-purpose digital I/O pin
O General-purpose digital I/O pin/Output terminal of crystal oscillator XT2
I
General-purpose digital I/O pin/Input port for crystal oscillator XT2. Only standard
crystals can be connected.
O Output terminal of crystal oscillator XT2
I Input port for crystal oscillator XT2
I
Reset input, nonmaskable interrupt input port, or bootstrap loader start (in flash
devices).
I
Test clock (JTAG). TCK is the clock input port for device programming test and bootstrap
loader start.
I Test data input or test clock input. The device protection fuse is connected to TDI/TCLK.
I/O Test data output port. TDO/TDI data output or programming data input terminal.
I Test mode select. TMS is used as an input port for device programming and test.
I Input for an external reference voltage/DAC12.0 output
O Output of positive terminal of the reference voltage in the ADC12
I
Negative terminal for the reference voltage for both sources, the internal reference
voltage, or an external applied reference voltage
I Input port for crystal oscillator XT1. Standard or watch crystals can be connected.
O Output port for crystal oscillator XT1. Standard or watch crystals can be connected.
NA Reserved pins. Connection to D/AV_SS recommended.
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