AMC7823_15 Datasheet, PDF (6/55 Pages) Texas Instruments – ANALOG MONITORING AND CONTROL CIRCUIT

AMC7823
SLAS453F – APRIL 2005 – REVISED MARCH 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: +3V
At –40°C to +85°C, AV_DD, DV_DD, BV_DD = 3V, using external 1.25V reference, unless otherwise noted.
AMC7823
PARAMETER
TEST CONDITIONS
MIN TYP
ADC ANALOG INPUTS
Input voltage range
0
Input impedance
5
Input capacitance
15
Input leakage current
±1
ANALOG-TO-DIGITAL CONVERTER
Resolution
No missing codes
12
Integral linearity
–1.25
Differential linearity
–1
Offset error
Offset error drift
±4
Offset error match
0.5
Gain error
Gain error match
0.3
Noise
70
Power-supply rejection
AV_DD = 3V ±5%
70
Sample rate⁽²⁾
200
Total conversion time
Scan Channels 0 through 7
47
Total conversion time including temperature Scan Channels 0 through 8
58
Channel-to-channel isolation
V_IN = 2.5V_PP at 10kHz
0.5
DIGITAL-TO-ANALOG CONVERTER⁽³⁾
Output voltage range
Programmable
0
Output current
Refer to Typical Characteristics
±1
Resolution
Integral linearity⁽⁴⁾
±2
Monotonicity
12
Differential linearity
±0.2
Offset error
Output range = 0 to V_REF
Output range = 0 to 2 x V_REF
±0.5
±1
Offset error drift
±4
Gain error
Settling time
Output range = 0 to 2 x V_REF
±0.2
Step between code 0x400 to 0xC00,
to ±1LSB
2
Code change glitch
1LSB change, in worst case
20
Overshoot
Step between code 0x400 to 0xC00
200
Crosstalk
Step between code 0x400 to 0xC00
<0.5
Signal-to-noise ratio
Sine wave (1kHz, 5V_PP) generated by DAC,
sampling at 400kSPS, R_L = 10kΩ,
74
C_L = 100pF
Output buffer gain = 2
60
Output noise voltage density
Output buffer gain = 1
30
MAX UNIT
2 × V_REF
V
MΩ
pF
μA
12 Bits
+1.25
Bits
LSB ⁽¹⁾
+1.25 LSB
±3 LSB
ppmFS/°C
1 LSB
±12 LSB
1.5 LSB
μV_RMS
dB
kHz
μs
μs
LSB
2 × V_REF
V
mA
12 Bits
±8 LSB
Bits
±1 LSB
±5 mV
±10 mV
ppmFS/°C
±1.0 %FS
μs
nV-s
mV
LSB
dB
nV/√Hz
nV/√Hz
(1) LSB means least significant bit.
(2) Single-channel conversion only. Does not include control logic delay associated with ADC operation, such as from the trigger signal to
the start of conversion.
(3) DAC is tested with load of 25kΩ in parallel with 100pF to ground.
(4) Measured from code 0x008 to 0xFFF.
6
Submit Documentation Feedback
Product Folder Link(s): AMC7823
Copyright © 2005–2012, Texas Instruments Incorporated