AMC7823_15 Datasheet, PDF (3/55 Pages) Texas Instruments – ANALOG MONITORING AND CONTROL CIRCUIT

AMC7823
www.ti.com
SLAS453F – APRIL 2005 – REVISED MARCH 2012
ELECTRICAL CHARACTERISTICS: +5V
At –40°C to +85°C, AV_DD = 5V, DV_DD = 5V, BV_DD = 3V to 5V, using external 2.5V reference, unless otherwise noted.
AMC7823
PARAMETER
TEST CONDITIONS
MIN TYP
MAX UNIT
ADC ANALOG INPUTS
Input voltage range
Input impedance
0
2 × V_REF
V
5
MΩ
Input capacitance
15
pF
Input leakage current
±1
μA
ANALOG-TO-DIGITAL CONVERTER
Resolution
12 Bits
No missing codes
Integral linearity
12
–1.25
+1.25
Bits
LSB ⁽¹⁾
Differential linearity
–1
+1.25 LSB
Offset error
±2 LSB
Offset error drift
±4
ppmFS/°C
Offset error match
0.5
1 LSB
Gain error
±6 LSB
Gain error match
0.3
1 LSB
Noise
Power-supply rejection
Sample rate⁽²⁾
AV_DD = 5V ±5%
70
μV_RMS
70
dB
200
kHz
Total conversion time
Scan Channels 0 through 7
45
μs
Total conversion time including temperature Scan Channels 0 through 8
56
μs
Channel-to-channel isolation
DIGITAL-TO-ANALOG CONVERTER⁽³⁾
V_IN = 5V_PP at 10kHz
0.5
LSB
Output voltage range
Output current
Programmable
Refer to Typical Characteristics
0
2 × V_REF
V
±1
mA
Resolution
Integral linearity⁽⁴⁾
12 Bits
±2
±8 LSB
Monotonicity
12
Bits
Differential linearity
±0.2
±1 LSB
Offset error
Offset error drift
Output range = 0 to V_REF
Output range = 0 to 2 × V_REF
±0.5
±5 mV
±1
±10 mV
±4
ppmFS/°C
Gain error
Settling time
Output range = 0 to 2 × V_REF
Step between code 0x400 to 0xC00,
to ±1LSB
±0.3
±1.0 %FS
2
μs
Code change glitch
1LSB change, in worst case
20
nV-s
Overshoot
Step between code 0x400 to 0xC00
200
mV
Crosstalk
Step between code 0x400 to 0xC00
< 0.5
LSB
Signal-to-noise ratio
Output noise voltage density
Sine wave (1kHz, 5V_PP) generated by DAC,
sampling at 400kSPS, R_L = 10kΩ,
C_L = 100pF
Output buffer gain = 2
Output buffer gain = 1
74
dB
60
nV/√Hz
30
nV/√Hz
(1) LSB means least significant bit.
(2) Single-channel conversion only. Does not include control logic delay associated with ADC operation, such as from the trigger signal to
the start of conversion.
(3) DAC is tested with load of 25kΩ in parallel with 100pF to ground.
(4) Measured from code 0x008 to 0xFFF.
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): AMC7823
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