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TLK1201IRCPRG4 Datasheet, PDF (13/22 Pages) Texas Instruments – ETHERNET TRANSCEIVERS
TLK1201RCP, TLK1201IRCP
ETHERNET TRANSCEIVERS
TX+
tr
TX−
VOD
tf
80%
20%
80%
50%
20%
tf
80%
50%
20%
tr
0V
∼V
∼V
∼V
∼V
∼ 1V
∼ −1V
SLLS506E − AUGUST 2001 − REVISED MAY 2007
CL
5 pF
CL
5 pF
50 Ω
50 Ω
Figure 7. Differential and Common-Mode
Output Voltage Definitions
Figure 8. Transmitter Test Setup
LVTTL output switching characteristics over recommended operating conditions (unless
otherwise noted)
tr(RBC)
tf(RBC)
tr
tf
tsu(D1)
th(D1)
tsu(D2)
th(D2)
tsu(D3)
th(D3)
PARAMETER
TEST CONDITIONS
Clock rise time
Clock fall time
Data rise time
80% to 20% output voltage, C = 5 pF (see Figure 9)
Data fall time
Data setup time (RD0..RD9), Data
valid prior to RBC0 rising
TBI normal mode, (see Figure 3)
Data hold time (RD0..RD9), Data valid
after RBC0 rising
TBI normal mode, (see Figure 3)
Data setup time (RD0..RD4)
Data hold time (RD0..RD4)
Data setup time (RD0..RD9)
Data hold time (RD0..RD9)
DDR mode, Rω = 125 MHz, (see Figure 4)
DDR mode, Rω = 125 MHz, (see Figure 4)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
MIN TYP MAX UNIT
0.3
1.5
ns
0.3
1.5
0.3
1.5
0.3
1.5 ns
2.5
ns
2
ns
2
ns
0.8
ns
2.5
ns
1.5
ns
CLOCK
1.4 V
tr
tf
DATA
tr
80%
50%
20%
tf
2V
0.8 V
Figure 9. TTL Data I/O Valid Levels for AC Measurement
transmitter timing requirements over recommended operating conditions (unless otherwise
noted)
tsu(D4)
th(D4)
tsu(D5)
th(D5)
tr, tf
PARAMETER
Data setup time (TD0..TD9)
Data hold time (TD0..TD9)
Data setup time (TD0..TD9)
Data hold time (TD0..TD9)
TD[0,9] data rise and fall time
TEST CONDITIONS
TBI modes
DDR modes
See Figure 9
MIN TYP MAX UNIT
1.6
ns
0.8
0.7
ns
0.5
2 ns
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