M39432 Datasheet, PDF (16/28 Pages) STMicroelectronics – Single Chip 4 Mbit Flash Memory and 256 Kbit Parallel EEPROM

M39432
Table 13. Read Mode AC Characteristics
(T_A = –40 to 85 °C; V_CC = 2.7 V to 3.6 V)
M39432
Symbol Alt.
Parameter
Test Condition
-100
-120
-150
Unit
Min Max Min Max Min Max
(EE,EF,G) =
t_AVAV
t_RC
Address Valid to
Next Address Valid
(V_IL,V_IH,V_IL)
or (EE,EF,G) =
100
120
150
ns
(V_IH,V_IL,V_IL)
(EE,EF,G) =
t_AVQV
t_ACC
Access Time: Address Valid
to Output Valid
(V_IL,V_IH,V_IL)
or (EE,EF,G) =
100
120
150 ns
(V_IH,V_IL,V_IL)
t_ELQX1
t_LZ
Chip Enable Low to
Output Transition
G = V_IL
0
0
0
ns
t_ELQV2
t_CE
Access Time: Chip Enable
Low to Output Valid
G = V_IL
100
120
150 ns
t_GLQX1
t_OLZ
Output Enable Low to
Output Transition
(EE,EF) = (V_IL,V_IH)
or
0
(EE,EF) = (V_IH,V_IL)
0
0
ns
t_GLQV2
t_OE
Output Enable Low to
Output Valid
(EE,EF) = (V_IL,V_IH)
or
(EE,EF) = (V_IH,V_IL)
40
55
55 ns
t_EHQX
t_OH
Chip Enable High to
Output Transition
G = V_IL
0
0
0
ns
t_EHQZ1
t_HZ
Chip Enable High to
Output Hi-Z
G = V_IL
30
40
40 ns
t_GHQX
t_OH
Output Enable High to
Output Transition
(EE,EF) = (V_IL,V_IH)
or
0
(EE,EF) = (V_IH,V_IL)
0
0
ns
t_GHQZ1
t_DF
Output Enable High to
Output Hi-Z
(EE,EF) = (V_IL,V_IH)
or
(EE,EF) = (V_IH,V_IL)
30
40
40 ns
(EE,EF,G) =
t_AXQX
t_OH
Address Transition to Output
Transition
(V_IL,V_IH,V_IL)
or (EE,EF,G) =
0
0
0
ns
(V_IH,V_IL,V_IL)
t_EHFL
t_CED
EE Active to EF Active
or EF Active to EE Active
100
100
100
ns
Note: 1. Sampled only, not 100% tested.
2. G may be delayed by up to t_ELQV - t_GLQV after the falling edge of EE (or EF) without increasing t_ELQV.
Table 14. Input and Output Parameters¹ (T_A = 25 °C, f = 1 MHz)
Symbol
Parameter
Test Condition
C_IN Input Capacitance
V_IN = 0V
C_OUT Output Capacitance
Note: 1. Sampled only, not 100% tested.
V_OUT = 0V
Min.
Max.
6
12
Unit
pF
pF
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