SI598 Datasheet, PDF (10/28 Pages) Silicon Laboratories – Programmable with 28 parts per trillion frequency resolution

Si598/Si599
Table 11. Environmental Compliance
The Si598/599 meets the following qualification test requirements.
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solder Heat
Moisture Sensitivity Level
Contact Pads
Conditions/Test Method
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2036
J-STD-020, MSL1
Gold over Nickel
Table 12. Programming Constraints and Timing
(Typical values TA = 25 ºC, VDD = 3.3 V, min/max limits VDD = 1.8 ±5%, 2.5 or 3.3 V ±10%, TA = –40 to 85 ºC unless
otherwise noted)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Output Frequency Range
Frequency Reprogramming
Resolution
CKO_F
M_RES
10
—
810
MHz
—
28
—
ppt
Internal Oscillator Frequency
Internal Crystal Frequency
Accuracy
f_OSC
f_XTAL
Maximum variation is
±2000 ppm
4850
—
—
39.17
5670
—
MHz
MHz
Delta Frequency for
Continuous Output
From center frequency –3500
—
+3500
ppm
Unfreeze to NewFreq
Timeout*
10
ms
Settling Time for Small
Frequency Change
<±3500 ppm from
—
—
100
µs
center frequency
Settling Time for Large
Frequency Change
>±3500 ppm from
—
—
10
ms
center frequency after
setting NewFreq bit
*Note: Applies when using large frequency change procedure outlined in section “3.1.2.Reconfiguring the Output Clock for
Large Changes in Output Frequency”.
10
Rev. 1.0