S6B0755 Datasheet, PDF (7/68 Pages) Samsung semiconductor – 128 SEG / 65 COM DRIVER & CONTROLLER FOR STN LCD

128 SEG / 65 COM DRIVER & CONTROLLER FOR STN LCD
PRELIMINARY SPEC. VER. 1.0
S6B0755
COG Align Key Coordinate
30µm 30µm 30µm
30µm 30µm 30µm
(+4503, +893
(-3965, -485)
ILB Align Key Coordinate
42µm
108µm
(-4668, +943)
108µm
42µm
(+4121, +394)
TOM(TEG On Main chip) Coordinate
The TOM has test items for process evaluation. There are many bumped PADs in this area as
like main chip. So when designing COG pattern, ITO pattern must be prohibited on this area
(TOM). If ITO pattern is used for routing over this area, it can be happened pattern-short
through bumped PAD on TOM.
220um
(4153.0, 200.0)
(3933.0, -400.0)
4