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PHN70308 Datasheet, PDF (4/10 Pages) NXP Semiconductors – N-channel enhancement mode TrenchMOS transistor array
Philips Semiconductors
N-channel enhancement mode
TrenchMOS transistor array
Product specification
PHN70308
SOURCE-DRAIN DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN.
IF
Continuous forward diode
Tsp = 50 ˚C
current
spindle FET; δ = 33.3% -
isolation FET -
IFRM
Repetitive peak forward diode
current
spindle FET -
isolation FET -
VF
Diode forward voltage
IF = 1.25 A; VGS = 0 V
spindle FET -
isolation FET -
trr
Reverse recovery time
IF = 1.25 A; -dIF/dt = 100 A/µs;
VDS = 25 V
spindle FET -
isolation FET -
TYP.
-
-
-
-
0.8
0.8
20
25
MAX. UNIT
5
A
5
A
20
A
20
A
1
V
1
V
-
ns
-
ns
Normalised Power Derating, Ptot (%)
100
90
80
70
60
50
40
30
20
10
0
0
20
40
60
80
100 120 140 160
Solder Point temperature, Tsp (C)
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tsp)
Normalised Current Derating, ID (%)
120
100
80
60
40
20
0
0
20
40
60
80
100 120 140 160
Solder Point temperature, Tsp (C)
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tsp); conditions: VGS ≥ 10 V
Normalised On-state Resistance
2
1.9
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
Junction temperature, Tj (C)
Fig.3. Normalised drain-source on-state resistance.
RDS(ON)/RDS(ON)25 ˚C = f(Tj)
Threshold Voltage, VGS(TO) (V)
3
2.75
2.5
2.25
2
1.75
typical
1.5
1.25
1
0.75
minimum
0.5
0.25
0
-60 -40 -20 0
20 40 60 80 100 120 140 160 180
Junction Temperature, Tj (C)
Fig.4. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
May 1999
4
Rev 1.000