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SAA4992H Datasheet, PDF (28/36 Pages) NXP Semiconductors – Field and line rate converter with noise reduction
Philips Semiconductors
Field and line rate converter with noise
reduction
Product specification
SAA4992H
9 LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
VDD
IDD
Io
Vi
Tstg
Tj
PARAMETER
supply voltage
supply current
output current
input voltage for all I/O pins
storage temperature
junction temperature
MIN.
−0.5
−
−
−0.5
−55
0
MAX.
+3.6
600
2.0
+3.6
+150
125
UNIT
V
mA
mA
V
°C
°C
10 THERMAL CHARACTERISTICS
SYMBOL
Rth(j-a)
Rth(j-c)
PARAMETER
CONDITIONS
thermal resistance from junction to ambient in free air
thermal resistance from junction to case
VALUE
27
2.9
UNIT
K/W
K/W
11 CHARACTERISTICS
VDD = 3.0 to 3.6 V; Tamb = 0 to 70 °C; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
General
VDD
supply voltage
IDD
supply current
VOH
HIGH-level output voltage
VOL
LOW-level output voltage
VIH
HIGH-level input voltage
VIL
LOW-level input voltage
IOL
LOW-level output current
Co(L)
output load capacitance
Ci
input capacitance
ILI
input leakage current
Outputs; note 1; see Fig.5
IOZ
output current in 3-state mode
td(o)
output delay time
th(o)
output hold time
SR
slew rate
−0.5 < Vo < 3.6
Inputs; note 2; see Fig.5
tsu(i)
input set-up time
th(i)
input hold time
MIN.
3.0
−
2.4
−
2.0
0
−
−
−
−
−
−
4
300
8
2
TYP.
3.3
400
−
−
−
−
−
−
−
−
−
−
−
−
−
−
MAX.
3.6
550
−
0.4
3.6
0.8
2
50
8
1
1
21
−
700
−
−
UNIT
V
mA
V
V
V
V
mA
pF
pF
µA
µA
ns
ns
mV/ns
ns
ns
2000 Feb 04
28