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M5M410092BRF Datasheet, PDF (139/204 Pages) Mitsubishi Electric Semiconductor – 3D-RAM (M5M410092B) | |||
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MITSUBISHI
ELECTRONIC DEVICE GROUP
Rev. 1.03
3D-RAM (M5M410092B)
Boundary-Scan Timing Parameters
Table 7.8 Boundary-Scan timing parameters
Symbol
Parameter
tSCLK
tSCLKH
tSCLKL
tSCNTS
tSCNTH
tSCNIS
tSCNIH
tSLZ
tSQ
tSVD
tSHZ
tSCNRS
tSCNRP
SCAN_TCK cycle time
SCAN_TCK high pulse width
SCAN_TCK low pulse width
SCAN_TMS setup time
SCAN_TMS hold time
SCAN_TDI setup time
SCAN_TDI hold time
SCAN_TCK to SCAN_TDO low impedance
SCAN_TDO access time
SCAN_TDO data valid time
SCAN_TCK to SCAN_TDO high impedance
SCAN_RST setup time
SCAN_RST pulse width
M5M410092B
-10A, -10, -12
Min Max
100
â
40
â
40
â
8
â
26
â
8
â
26
â
â
20
â
26
8
â
â
20
8
â
30
â
Unit Refer
ns
t1
ns
t2
ns
t3
ns
t8
ns
t9
ns
t8
ns
t9
ns t18
ns t19
ns t20
ns t21
ns
t6
ns
t7
Ch. 8
Figure
17
17
17
17
17
17
17
17
17
17
17
18
18
115
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