MIC3002_10 Datasheet, PDF (37/65 Pages) Micrel Semiconductor – FOM Management IC with Internal Calibration

Micrel, Inc.
MIC3002
Test and Calibration Features
Numerous features are included in the MIC3002 to
facilitate development, testing, and diagnostics. These
features are available via registers in the OEM area. As
shown in Table 24, these features include:
Function
Description
Analog loop-back
Fault comparator disable control
Fault comparator spin-on-channel
mode
Fault comparator output read-back
RSOUT, /INT read-back
Inhibit EEPROM write cycles
APC calibration mode
Continuity checking
Halt A/D
ADC idle flag
A/D one-shot mode
A/D spin-on-channel mode
Channel selection
LUT index read-back
Manufacturer and device ID registers
Provides analog visibility of op-amp and DAC outputs via the ADC
Disables the fault comparator
Selects a single fault comparator channel
Allows host to read individual fault comparator outputs
Allows host to read the state of these pins
Speeds repetitive writes to registers backed up by NVRAM
Allows direct writes to MODDAC and APCDAC (temperature
compensation not used)
Forcing of RXLOS, TXFAULT, /INT
Stops A/D conversions; ADC in one-shot mode
Indicates ADC status
Performs a single A/D conversion on the selected input channel
Selects a single input channel
Selects ADC or fault comparator channel for spin-on-channel
modes
Permits visibility of the LUT index calculated by the state-machine
Facilitates presence detection and version control
Table 24. Test and Diagnostic Features
Control
Register(s)
OEMCFG0
OEMCAL0
OEMCAL0
OEMRD
OEMRD
OEMCAL0
OEMCAL0
OEMCAL0
OEMCAL1
OEMCAL1
OEMCAL1
OEMCAL1
OEMCAL1
LUTINDX
MFG_ID,
DEV_ID
July 2007
37
M9999-073107-B
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