MLX90363 Datasheet, PDF (43/57 Pages) Melexis Microelectronic Systems – Triaxis® Magnetometer IC With High Speed Serial Interface

MLX90363
Triaxis® Magnetometer IC
With High Speed Serial Interface
18. MLX90363 Self Diagnostic
The MLX90363 provides numerous self-diagnostic features which increase the safety integrity level of the
IC, by diagnosing and reporting as many as 18 internal and external failure cases.
Diagnostic Item
RAM March C- 10N Test
Watchdog BIST
ROM 16 bit Checksum
RAM Test (continuous)
CPU Register Functional Test
EEPROM Calibration parameters (8 bit CRC)
EEPROM Hamming Code DED (Dual Error Detection)
EEPROM RAM Cache Error
ADC Block
Bz sensitivity monitor⁽²⁵⁾
Bx sensitivity monitor⁽²⁵⁾
By sensitivity monitor⁽²⁵⁾
Temperature sensor monitoring (based on redundancy)
Temperature > 190 deg (± 20deg)
Temperature < -80 deg (± 20deg)
Field magnitude too high (Norm > 99% ADC Span⁾⁽²⁴⁾
Action
Bit
Fail-safe mode
D0
Fail-safe mode
D1
Fail-safe mode
D2
Fail-safe mode
D3
Fail-safe mode
D4
Fail-safe mode
D5
Fail-safe mode
D6
Report⁽²³⁾
D7
Report
D8
Report
(Optional)
D12
Report
D13
Report
D14
Report, temp.
value set to
D15
EE_T35
Report, saturate
temp. value
D16
Report
D17
Field magnitude too low (Norm < 20% ADC Span)
Report
D18
ADC clipping (X, Y, Z, two phases each)
Supply voltage monitor (VDD) and Regulator monitor
(VDEC)⁽²⁵⁾
Firmware Flow monitoring
Read/Write Access out of physical memory
Stack Overflow
Write Access to protected area (IO and RAM Words)
Unauthorized entry in “SYSTEM” Mode
Serial Interface Protection Error
Watchdog Timeout
Oscillator Frequency (Dedicated SCI Command)
Report
D19
Report
(Optional)
D20
Fail-safe mode
n/a
Fail-safe mode
n/a
Fail-safe mode
n/a
Fail-safe mode
n/a
Fail-safe mode
n/a
NTT
Message⁽²⁶⁾
n/a
Reset⁽²⁷⁾
n/a
n/a
n/a
VDD > MT8V
MISO is HiZ
n/a
Figure 25 – Diagnostics List
Notes
At Startup only
At Startup only
Reference Voltage Unit (VCM)
+ 11 Input Levels
See Magnetic Frequency Spec.
See Magnetic Frequency Spec.
See Magnetic Frequency Spec.
External failure
External failure, given that
AGC keeps Norm below 63.5%
External failure, given that
AGC keeps Norm above 47%
External failure
External failure
Diagnostic performed by master
100% Hardware detection.
No communication possible.
23 _{Reporting is done through the bits E0 and E1 of the regular messages or the bits Dx of the DiagnosticDetails message. See}
Table 8 for more details.
24 _{Norm = max(abs(X),abs(Y),abs(Z))}
25 _{Diagnostic to be disabled in the 3V3 application diagram (VDD = VDEC).}
26 _{The NTT Message is followed by an Error Message.}
27 _{Resetting has the same effects as a POR: the next SO message is therefore Ready.}
3901090363
Rev. 005
Page 43 of 57
Data Sheet
Jul/13