W9082B Datasheet, PDF (8/19 Pages) Keysight Technologies – X-Series Measurement Application

08 | Keysight | LTE and LTE-Advanced FDD/TDD X-Series Measurement Application - Technical Overview
Measurement Summary (continued)
One-button standards-based measurements
Required user equipment (UE) RF transmitter measurements
3GPP TS 36.521-1 paragraph #
Transmitter test
LTE Rel 8
and up
6.2.2
6.2.3
6.2.4
6.2.5
6.3.2
6.3.3
6.3.4
6.3.5
6.5.1
6.5.2.1
6.5.2.1A
6.5.2.2
6.5.2.3
6.5.2.4
6.6.1
6.6.2.1
6.6.2.2
6.6.2.3
6.6.3.1
6.6.3.2
LTE-
Advanced
CA
6.2.2A
6.2.3A
6.2.4A
6.2.5A
6.3.2A
6.3.3A
6.3.4A
6.3.5A
6.5.1A
6.5.2A.1
N/A
6.5.2A.2
6.5.2A.3
N/A
6.6.1A
6.6.2.1A
6.6.2.2A
6.6.2.3A
6.6.3.1A
6.6.3.2A
LTE-
Advanced
UL-MIMO
6.2.2B
6.2.3B
6.2.4B
6.2.5B
6.3.2B
6.3.3B
6.3.4B
6.3.5B
6.5.1B
6.5.2B.1
N/A
6.5.2B.2
6.5.2B.3
6.5.2B.4
6.6.1B
6.6.2.1B
6.6.2.2B
6.6.2.3B
6.6.3B.1
6.6.3B.2
6.6.3.3
6.7
N/A
6.6.3.3A
6.7A
N/A
6.6.3B.3
6.7B
6.8B
UE maximum output power (MOP)
Maximum power reduction (MPR)
Additional maximum power reduction (A-MPR)
Conigured UE transmitted output power
Minimum output power
Transmit off power
On/off time mask
Power control
Frequency error
Error vector magnitude (EVM)
PUSCH-EVM with exclusion period
Carrier leakage
In-band emissions for non-allocated RB
EVM equalizer spectrum latness
Occupied bandwidth
Spectrum emission mask (SEM)
Additional SEM
Adjacent channel leakage power ratio (ACLR)
Transmitter spurious emission
Spurious emission band UE
co-existence
Additional spurious emissions
Transmit intermodulation
Time alignment
N9080B & W9080B (FDD)
N9082B & W9082B (TDD)
measurement applications
Channel power
Channel power or transmit on/off power
Transmit on/off power
Not available
Frequency error ¹ and frequency error per slot ²
EVM ¹
EVM ¹
IQ offset ¹ and IQ offset per slot ²
In-band emissions ²
Equalizer channel frequency response per slot ³
Occupied BW
SEM
SEM
ACP
Spurious emissions
Spurious emissions
Spurious emissions
ACP
Time offset ¹
1. These values are found in “Error Summary” table under Mod Analysis measurement or under Conformance EVM measurements.
2. These measurements are part of the Mod Analysis measurement. Once in Mod Analysis, they are found under [Trace/Detector] -> {Data} > {Demod Error}.
3. This measurement is part of the Mod Analysis measurement. Once in Mod Analysis, it is found under [Trace/Detector] -> {Data} > {Response}.