W9082B Datasheet, PDF (2/19 Pages) Keysight Technologies – X-Series Measurement Application

02 | Keysight | LTE and LTE-Advanced FDD/TDD X-Series Measurement Application - Technical Overview
LTE/LTE-Advanced FDD and TDD Measurement
Applications
The LTE/LTE-Advanced FDD and TDD measurement applications transform the X-Series
signal analyzers into 3GPP LTE/LTE-Advanced standard-based RF transmitter testers. The
applications provide fast, one-button RF conformance measurements to help you design,
evaluate, and manufacture your LTE and LTE-Advanced base stations (eNB) and user
equipment (UE). The measurement applications closely follow the 3GPP standard, allowing
you to stay on the leading edge of your design and manufacturing challenges.
X-Series measurement applications
X-Series measurement applications increase the capability and functionality of Keysight
signal analyzers to speed time to insight. They provide essential measurements for speciic
tasks in general-purpose, cellular communications, wireless connectivity and digital
video applications, covering more than 40 standards or modulation types. Applications
are supported on both benchtop and modular, with the only difference being the level of
performance achieved by the hardware you select.
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