W9082B Datasheet, PDF (7/19 Pages) Keysight Technologies – X-Series Measurement Application

07 | Keysight | LTE and LTE-Advanced FDD/TDD X-Series Measurement Application - Technical Overview
Measurement Summary
One-button standards-based measurements
Required base station (eNB) RF transmitter measurements
3GPP TS36.141 Transmitter test
paragraph #
6.2
Base station output power
6.3.2
Total power dynamic range
6.4
Transmit ON/OFF power
(TDD only)
6.5.1
Frequency error
6.5.2
Error vector magnitude
6.5.3
Time alignment error (TAE)
6.5.4
DL RS power
6.6.1
Occupied bandwidth
6.6.2
Adjacent channel leakage power ratio (ACLR)
6.6.2.6
Cumulative ACLR (LTE-Advanced only)
6.6.3
Operating band unwanted
emissions (SEM)
6.6.3
Cumulative mask for SEM
(LTE-Advanced only)
6.6.4
Transmitter spurious emission
6.7
Transmitter intermodulation
E-TM required
E-TM 1.1
E-TM 2
E-TM 3.1
E-TM1.1
E-TM 2
E-TM 3.1
E-TM 3.2
E-TM 3.3
E-TM 1.1
E-TM 1.1
E-TM 1.1
E-TM 1.1
E-TM 1.2
E-TM 1.1
E-TM 1.2
E-TM 1.1
E-TM 1.2
E-TM 1.1
E-TM 1.2
E-TM 1.1
E-TM 1.1
N9080B & W9080B (FDD)
N9082B & W9082B (TDD)
measurement applications ¹
Channel power ²
OFDM symbol Tx. power (OSTP) ³
Transmit ON/OFF power (N9082B only) ⁴
Frequency error ³
EVM ³
MIMO summary or cross-carrier summary ⁵
RS Tx power (RSTP) ³
Occupied BW
ACP
ACP
Spectrum emission mask
Spectrum emission mask
Spurious emissions
ACP, SEM, spurious emissions
1. All of the measurements are available for single carrier (LTE) or multiple-carrier LTE-Advanced with up to 5 component carriers. Option 1FP is LTE, Option
2FP is LTE-Advanced.
2. These are pre-demodulation channel power measurements. Channel power reading is also available after demodulation under “Error Summary” trace.
3. These measurements are available under “Error Summary” trace in Mod Analysis as well as under “Conformance EVM” measurement.
4. For LTE-Advanced, this measurement is supported for contiguous carrier aggregation and requires analysis bandwidth on X-Series signal analyzer wide
enough to cover the aggregated bandwidth.
5. “MIMO Summary”/”MIMO Info Table” traces are used to measure TAE for MIMO and Tx diversity signals. For carrier aggregation, “Cross-carrier Summary”
trace is used to measure TAE.