W9082B Datasheet, PDF (6/19 Pages) Keysight Technologies – X-Series Measurement Application

06 | Keysight | LTE and LTE-Advanced FDD/TDD X-Series Measurement Application - Technical Overview
Top Features (continued)
Uplink UE measurements
Uplink modulation analysis
Uplink modulation analysis measurement showing constellation, EVM vs.
subcarrier, detected allocation, and EVM vs. symbol information for two
component carriers. Measurements are color-coded based on channel
type and up to 12 markers with marker coupling between measurements
are available for easier troubleshooting. (Figure 10)
Figure 10
Conformance EVM measurement
Conformance EVM measurement showing all required modulation quality
metrics. This measurement is optimized for manufacturing because of its
fast measurement speed. (Figure 11)
Figure 11
Real-time view of LTE-Advanced FDD uplink
Figure 12 shows a real-time view of LTE-Advanced FDD uplink with
simultaneous PUCCH and frequency hopped PUSCH signal coniguration
using the RTSA option on a PXA or MXA signal analyzer.
Figure 12