6000 Datasheet, PDF (17/41 Pages) List of Unclassifed Manufacturers – THE BREAD BOARDING MEDIUM FOR SURFACE MOUNT

17 | Keysight | InfiniiVision 6000 X-Series Oscilloscopes - Data Sheet
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Find events faster with search and navigation
features
Parametric and serial bus search and navigation features come
standard on the 6000 X-Series oscilloscopes. When you are
capturing long, complex waveforms using an oscilloscope’s
acquisition memory, manually scrolling through stored
waveform data to find specific events of interest can be slow and
cumbersome. With automatic search, navigation, and listing,
you can easily set up specific search criteria and then quickly
navigate to “found and marked” events. Available search criteria
include edges, pulse width (time-qualified), rise/fall times (time-
qualified), runt pulses (time- and level-qualified), frequency peaks
(up to 11 peaks), and serial bus frames, packets, and errors. The
side-bar lister gives you an overview of the time tag of each found
event relative to the trigger location.
Figure 42. Searching for and navigating to a specific pulse width.
Optional power measurements and analysis
When you are working with switching power supplies and
power devices, the power measurements application (Option
DSOX6PWR) provides a full suite of power measurements and
analysis in the oscilloscope. Included with Option DSOX6PWR
is a license for the U1881A PC-based power analysis software
package, which provides additional offline measurements and
report generation.
See www.keysight.com/find/DSOX6PWR for more information.
Automate your testing with optional USB 2.0
signal quality analysis
With the USB 2.0 signal quality test option (Option
DSOX6USBSQ), designers of systems with USB interfaces can
automate signal quality testing. This option supports low-speed,
full-speed, and hi-speed applications (hi-speed tests require an
oscilloscope with a bandwidth of at least 1.5 GHz). The USB 2.0
signal quality test with HTML pass/fail report generation includes
eye diagram mask testing, jitter analysis, EOP bit-width, signaling
rate, edge monotonicity, and rise/fall times — all based on official
USB-IF algorithms embedded in the oscilloscope.
Figure 43. Power quality analysis screenshot.
See www.keysight.com/find/DSOX6USBSQ for more information.
Figure 44. USB 2.0 Hi-speed near-end eye pattern test.