ISL71841SEH Datasheet, PDF (23/29 Pages) Intersil Corporation – Radiation Hardened 30V 32-Channel Analog

ISL71841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± = ±12V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
2
350
0
300 ^BIASED
-2
250
-4
GROUNDED
200
GROUNDED
-6
150
-8
100
-10
BIASED
-12
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 73. r_DS(ON) SHIFT (V_IN = V^-) vs LDR RADIATION
50
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 74. t_ADD SHIFT (LOW TO HIGH) vs LDR RADIATION
20
15
10
BIASED
5
0
-5
-10
GROUNDED
-15
-20
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 75. t_ADD SHIFT (HIGH TO LOW) vs LDR RADIATION
16
14
GROUNDED
12
10
8
BIASED
6
4
2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 76. t_BBM SHIFT vs LDR RADIATION
25
20
BIASED
15
10
5
0
GROUNDED
-5
-100
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 77. t_ENABLE SHIFT vs LDR RADIATION
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300
250
200
BIASED
150
100
GROUNDED
50
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 78. t_DISABLE SHIFT vs LDR RADIATION
FN8735.4
June 3, 2016