ISL71841SEH Datasheet, PDF (21/29 Pages) Intersil Corporation – Radiation Hardened 30V 32-Channel Analog

ISL71841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
0
250
-1
BIASED
-2
200
-3
GROUNDED
-4
150
GROUNDED
-5
-6
100
-7
-8
50
-9
BIASED
-10
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 61. r_DS(ON) SHIFT (V_IN = V^-) vs LDR RADIATION
FIGURE 62. t_ADD SHIFT (LOW TO HIGH) vs LDR RADIATION
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-1000
BIASED
GROUNDED
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 63. t_ADD SHIFT (HIGH TO LOW) vs LDR RADIATION
14
GROUNDED
12
10
8
6
BIASED
4
2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 64. t_BBM SHIFT vs LDR RADIATION
20
15
BIASED
10
5
0
GROUNDED
-5
-100
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 65. t_ENABLE SHIFT vs LDR RADIATION
Submit Document Feedback ₂₁
300
250 ^BIASED
200
GROUNDED
150
100
50
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 66. t_DISABLE SHIFT vs LDR RADIATION
FN8735.4
June 3, 2016