ISL71841SEH Datasheet, PDF (20/29 Pages) Intersil Corporation – Radiation Hardened 30V 32-Channel Analog

ISL71841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
1.2
0
1.0
GROUNDED
0.8
0.6
BIASED
0.4
0.2
-0.2
BIASED
-0.4
-0.6
-0.8
-1.0
-1.2
GROUNDED
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 55. I_CC SUPPLY CURRENT SHIFT vs LDR RADIATION
-1.4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 56. I_EE SUPPLY CURRENT SHIFT vs LDR RADIATION
2.5
2.0
GROUNDED
1.5
BIASED
1.0
0.5
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 57. I_REF SUPPLY CURRENT SHIFT vs LDR RADIATION
10
8
BIASED
6
4
2
0
GROUNDED
-2
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 58. r_DS(ON) SHIFT (V_IN = +5V) vs LDR RADIATION
6
5
4
BIASED
3
2
1
GROUNDED
0
-1
-2
-3
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 59. r_DS(ON) SHIFT (V_IN = -5V) vs LDR RADIATION
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25
20
15
BIASED
10
5
0
GROUNDED
-5
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 60. r_DS(ON) SHIFT (V_IN = V⁺) vs LDR RADIATION
FN8735.4
June 3, 2016