ISL71841SEH Datasheet, PDF (22/29 Pages) Intersil Corporation – Radiation Hardened 30V 32-Channel Analog

ISL71841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± = ±12V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
1.2
0
1.0
GROUNDED
0.8
0.6
BIASED
0.4
0.2
-0.2
-0.4
BIASED
-0.6
-0.8
-1.0
GROUNDED
-1.2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 67. I_CC SUPPLY CURRENT SHIFT vs LDR RADIATION
-1.4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 68. I_EE SUPPLY CURRENT SHIFT vs LDR RADIATION
2.5
2.0
GROUNDED
1.5
1.0
BIASED
0.5
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 69. I_REF SUPPLY CURRENT SHIFT vs LDR RADIATION
35
30
25
20
BIASED
15
10
5
0
GROUNDED
-50
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 70. r_DS(ON) SHIFT (V_IN = V⁺) vs LDR RADIATION
12
10
8
BIASED
6
4
2
0
GROUNDED
-2
-4
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 71. r_DS(ON) SHIFT (V_IN = +5V) vs LDR RADIATION
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8
6
GROUNDED
4
2
BIASED
0
-2
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 72. r_DS(ON) SHIFT (V_IN = -5V) vs LDR RADIATION
FN8735.4
June 3, 2016