C868 Datasheet, PDF (74/82 Pages) Infineon Technologies AG – 8-Bit Single-Chip Microcontroller

C868
A/D Converter Characteristics
(Operating Condition Parameters)
Parameter
Symbol
Limits
Unit Test Condition
Analog input voltage
Sample time
V_AIN
t_S
Conversion cycle time t_ADCC
Total unadjusted error T_UE
ADC input resistance R_AIN
ADC input capacitance C_AIN
ADC reference pin
capacitance
C_AREF
min
max
V_AGND V_AREF V
1)
64*t_SYS
52*t_SYS
48*t_SYS
40*t_SYS
32*t_SYS
24*t_SYS
16*t_SYS
8*t_SYS
512*t_SYS ns
448*t_SYS
384*t_SYS
320*t_SYS
256*t_SYS
192*t_SYS
128*t_SYS
64*t_SYS
Prescaler/32
Prescaler/28
Prescaler/24
Prescaler/20
Prescaler/16
Prescaler/12
Prescaler/8
Prescaler/4
322*t_SYS 770*t_SYS ns Prescaler/32
282*t_SYS 674*t_SYS
Prescaler/28
242*t_SYS 578*t_SYS
Prescaler/24
202*t_SYS 482*t_SYS
Prescaler/20
162*t_SYS 386*t_SYS
Prescaler/16
122*t_SYS 290*t_SYS
Prescaler/12
82*t_SYS 194*t_SYS
Prescaler/8
42*t_SYS 98*t_SYS
Prescaler/4
–
±2
LSB V_AGND ≤ V_AIN ≤ V_AREF2)
±3
V_AGND ≤ V_AIN ≤ V_AREF3)
–
1.5
kΩ ⁴⁾⁵⁾
–
10
pF ⁵⁾
–
40
pF ⁵⁾
Note:
1) _{VAIN may exceed VAGND or VAREF up to the maximum ratings. However, the conversion result in these}
cases will be 00_H or FF_H, respectively.
2) _{TUE (max.) is tested at – 20 ≤ TA ≤ 125 °C; VDDP = 3.3 V; VAREF = VDDP V and VSSP = VAGND. It is guaranteed}
by design characterization for all other voltages within the defined voltage range.
3) _{TUE (max.) is tested at – 40 ≤ TA < – 20 °C; VDDP ≤ 3.3 V; VAREF = VDDP and VSSP = VAGND. It is guaranteed}
by design characterization for all other voltages within the defined voltage range.
Data Sheet
74
V 1.0, 2003-05