XC2734X Datasheet, PDF (73/106 Pages) Infineon Technologies AG – 16/32-Bit Single-Chip Microcontroller with 32-Bit Performance

XC2734X
XC2000 Family / Value Line
Electrical Parameters
4) The broken wire detection delay against V_AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10 μs. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332_H)
5) TUE is tested at V_AREF = V_DDPA = 5.0 V, V_AGND = 0 V. It is verified by design for all other voltages within the
defined voltage range. The specified TUE is valid only if the absolute sum of input overload currents on analog
port pins (see I_OV specification) does not exceed 10 mA, and if V_AREF and V_AGND remain stable during the
measurement time.
6) V_AIN may exceed V_AGND or V_AREF up to the absolute maximum ratings. However, the conversion result in these
cases will be X000_H or X3FF_H, respectively.
V _AIN
R_Source
C _Ext
R_{AIN, On}
A/D Converter
C _AINT - C _AINS
C_AINS
Figure 16 Equivalent Circuitry for Analog Inputs
MCS05570
Data Sheet
73
V1.3, 2010-04