TC1920 Datasheet, PDF (51/78 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1920
Preliminary
Parameter
Total unadjusted error⁴⁾
Symbol
TUE
CC
Limit values
min. typ.
max.
± 1 LSB
Unit Test
Conditions
for 8- bit
conversion
± 2 LSB
± 6 LSB⁵⁾
for 10- bit
conversion
for 12- bit
conversion
On resistance of the
R_AIN
transmission gates in the CC
analog voltage path⁷⁾
1900
Ohm
Resistance of the
R_REF
reference voltage path⁷⁾ CC
2000
Ohm
Switched capacitance at C_AINSW
10
pF
the analog voltage input.⁷⁾ CC
Total capacitance at
C_AINTOT -
15 -
pF
analog voltage input ⁶⁾ CC
Switched capacitance at C_AREFSW
15
pF
the positive reference
CC
voltage input.⁷⁾
1) _{Analog overload conditions during operation occur if the voltage on the respective ADC pin exceeds the}
specified operating range (i.e. V_AOV > V_DDP+0.3V or V_AOV < V_SSP-0.3V ) or a short circuit condition occurs on
the respective ADC pin. The absolute sum of input leakage and I_AOV currents on all port pins must not exceed
10 mA at any time. The supply voltage (V_DD, V_DDP and V_SS, V_SSP) must remain within the specified limits.
Under short-circuit conditions the corresponding pin is not ready for use.
2) _{The overload coupling factor (kA) defines the worst case relation of an overload condition (IOV) at one pin to}
the resulting total leakage current (I_leakTOT) into an adjacent pin: |I_leakTOT| = k_A × |I_OV| + I_OZ1V
Thus under overload conditions an additional error leakage voltage (V_AEL) will be induced onto an adjacent
analog input pin due to the resistance of the analog input source (R_AIN). That means V_AEL = R_AIN × |I_leakTOT|.
Please see also the analog/digital converter specification, chapter “Error Through Overload Conditions”, for
further explanations.
3) _{The nominal conversion time is valid for VAREF>3.0. For VAREF<3.0, it is approximately double.}
4) _{At VAREF=+3.3V and VAGND in the specified range. For VAREF<3.3V, TUE rise and is to be multiplied with a}
factor of 3.3/Vref. For V_AGND outside the specified range, TUE is not guaranteed.
5) _{Tested in production on request. Standard production test is 10-bit TUE test.}
6) _{Not subject to production test, verified by design/characterization.}
7) _{Simulation values.}
Data Sheet
47
V 1.3, 2003-10