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TLE8209-2 Datasheet, PDF (12/41 Pages) Infineon Technologies AG – SPI Programmable H-Bridge
TLE8209-2
Power Supply
5.4
Electrical Characteristics Power Supply and VDD-Monitoring
Electrical Characteristics: Power Supply and VDD-Monitoring
VS = 5 V to 28 V; VDD = 5.0 V, Tj = -40 ⋅C to 150 ⋅C, all voltages with respect to ground, positive current flowing
into pin (unless otherwise specified)
Pos. Parameter
Symbol
Limit Values
Unit Test Conditions
Min. Typ. Max.
Supply
5.4.1 Supply Current
IVS
5.4.2
5.4.3
5.4.4
Functional Reset Threshold VDD_RES
Power On Reset Threshold VDD_POR
Power On Reset Delay
tPOR
Time
–
8
20
µA
IOUT = 0 A, VDD = 0V,
VS < 18 V, Tj < 125°C
–
2.1 4
mA bridge disabled,
IOUT = 0 A,
5 V < VS < 18 V
–
2.5 5
mA f = 2 kHz, IOUT = 0 A,
5 V < VS < 18 V
–
4
9
mA f = 10 kHz, IOUT = 0 A,
5 V < VS < 18 V
–
4.8 13
mA f = 10 kHz, IOUT = 0 A,
5 V < VS < 28 V
–
1.4 2.5 V
–
3.5 3.75 4.0 V
–
–
0.22 0.5
ms VDD = on --> output
stage active, no load
5.4.5
5.4.6
VDD Input current
VDDIO Input current
IDD
IDDIO
–
7
9
mA 4.5V < VDD < 5.5V
–
30
100 µA SPI-mode
no load at SO
no SPI communication
5.4.7 SF-mode Threshold
VDDIO_L
–
–
1.0 V
5.4.8 SPI-mode Threshold
VDDIO_H
2.0 –
–
V
5.4.9
Mode selection hysteresis VDDIO_HYS
0.2
0.5
1.0
V
VDD-Monitoring
5.4.10 Overvoltage threshold
VDD_THH
5.25 5.4 5.5 V
5.4.11 Undervoltage threshold
VDD_THL
4.2 4.3 4.4 V
5.4.12 Test mode reduced
Overvoltage threshold
VDD_TEST_H
4.2
4.3
4.4
V
–
–
–
Voltage referred to
GNDABE
5.4.13 Test mode increased
VDD_TEST_L 5.25 5.4
5.5
V
Undervoltage threshold
5.4.14 Filter time for glitch
tFIL
suppression
60
100 135 μs –
5.4.15 Maximum Slew Rate on VDD_slew
–
–
0.5 V/µs –
VDD1)
1) Not subject to production test; specified by design
Data Sheet
12
Rev. 1.4, 2014-10-28