841S104EGILF Datasheet, PDF (8/22 Pages) Integrated Device Technology – Crystal-to-HCSL 100MHz PCI ExpressTM Clock Synthesizer

ICS841S104I Data Sheet
CRYSTAL-TO-HCSL 100MHZ PCI EXPRESS^TM CLOCK SYNTHESIZER
AC Electrical Characteristics
Table 6B. AC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
f_MAX
f_REF
tjit(Ø)
Output Frequency
Reference frequency
Phase Jitter, RMS (Random);
NOTE 1
25MHz crystal, ƒ= 100MHz,
Integration Range: 12kHz – 20MHz
tsk(o)
Output Skew; NOTE 2, 3
tjit(cc) Cycle-to-Cycle Jitter; NOTE 2
PLL Mode
t_L
PLL Lock Time
F_M
SSC Modulation Frequency;
NOTE 4
25MHz Crystal
SSC_RED
V_RB
Spectral Reduction; NOTE 4
Ring-back Voltage Margin;
NOTE 5, 6
V_MAX
Absolute Max. Output Voltage;
NOTE 7, 8
V_MIN
Absolute Min. Output Voltage;
NOTE 7, 9
V_CROSS
Absolute Crossing Voltage;
NOTE 7, 10, 11
∆V_CROSS
Total Variation of V_CROSS over
all edges; NOTE 7, 10, 12
Rise/Fall Edge Rate;
NOTE 7, 13
Measured between 150mV to +150mV
odc
Output Duty Cycle
Minimum
30
-7
-100
-300
250
0.6
48
Typical
100
25
1.145
32
-10
Maximum
40
20
50
33.33
100
1150
550
140
4.0
52
Units
MHz
MHz
ps
ps
ps
ms
kHz
dB
mV
mV
mV
mV
mV
V/ns
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: Characterized using a 25MHz quartz crystal.
NOTE 1: Refer to phase jitter plot.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cross
points.
NOTE 4: Spread Spectrum clocking enabled.
NOTE 5: Measurement taken from differential waveform.
NOTE 6: T_STABLE is the time the differential clock must maintain a minimum ± 150mV differential voltage after rising/falling edges before it is
allowed to drop back into the V_RB ±100mV differential range.
NOTE 7: Measurement taken from single-ended waveform.
NOTE 8: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 9: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 10: Measured at crossing point where the instantaneous voltage value of the rising edge of SRCT equals the falling edge of SRCC.
NOTE 11: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing
points for this measurement.
NOTE 12: Defined as the total variation of all crossing voltages of rising SRCT and falling SRCC, This is the maximum allowed variance in
Vcross for any particular system.
NOTE 13: Measured from -150mV to +150mV on the differential waveform (SRCT minus SRCC). The signal must be monotonic through the
measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.
ICS841S104EGI REVISION A JUNE 18, 2010
8
©2010 Integrated Device Technology, Inc.