841S104EGILF Datasheet, PDF (10/22 Pages) Integrated Device Technology – Crystal-to-HCSL 100MHz PCI ExpressTM Clock Synthesizer

ICS841S104I Data Sheet
Parameter Measurement Information
3.3V±5%
3.3V±5%
V_DD
33Ω
V_DDA
HCSL
IREF
33Ω
GND
475Ω
0V
Measurement
50Ω
Point
49.9Ω
2pF
50Ω
Measurement
Point
49.9Ω
2pF
3.3V HCSL Output Load AC Test Circuit
CRYSTAL-TO-HCSL 100MHZ PCI EXPRESS^TM CLOCK SYNTHESIZER
3.3V±5%
3.3V±5%
V_DD
50Ω
V_DDA
HCSL
50Ω
IREF
GND
475Ω
SCOPE
0V
This load condition is used for I_DD, tjit(cc), tjit(Ø), and tsk(o)
measurements.
3.3V HCSL Output Load AC Test Circuit
SRCC[1:4]
SRCT[1:4]
tcycle n
➤
tcycle n+1
➤
| | ^{tjit(cc) =} tcycle n – tcycle n+1
1000 Cycles
Cycle-to-Cycle Jitter
SRCCx
SRCCx
SRCTy
SRCTy
t sk(o)
Output Skew
VMAX = 1.15V
SRCC
VCROSS_MAX = 550mV
VCROSS_MIN = 250mV
SRCT
VMIN = -0.30V
SRCC
VCROSS_DELTA = 140mV
SRCT
Single-ended Measurement Points for Absolute Cross
Point and Swing
Single-ended Measurement Points for Delta Cross Point
ICS841S104EGI REVISION A JUNE 18, 2010
10
©2010 Integrated Device Technology, Inc.