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HY57V281620ET Datasheet, PDF (8/13 Pages) Hynix Semiconductor – 128Mb Synchronous DRAM based on 2M x 4Bank x16 I/O
Synchronous DRAM Memory 128Mbit (8Mx16bit)
HY57V281620E(L)T(P) Series
CAPACITANCE (TA= 0 to 70 oC, f=1MHz, VDD=3.3V)
Parameter
Pin
Input capacitance
CLK
A0 ~ A11, BA0, BA1, CKE, CS, RAS, CAS,
WE, LDQM, UDQM
Data input / output capacitance DQ0 ~ DQ15
Symbol Min Max Unit
CI1
2.0 4.0 pF
CI2
2.5 5.0 pF
CI/O
3.0 5.5 pF
DC CHARACTERISTICS I (TA= 0 to 70oC)
Parameter
Symbol
Min
Input Leakage Current
ILI
-1
Output Leakage Current
ILO
-1
Output High Voltage
VOH
2.4
Output Low Voltage
VOL
-
Note:
1. VIN = 0 to 3.3V, All other balls are not tested under VIN =0V
2. DOUT is disabled, VOUT=0 to 3.6
Max
1
1
-
0.4
Unit
uA
uA
V
V
Note
1
2
IOH = -2mA
IOL = +2mA
Rev. 1.1 / Jan. 2005
8