HY29F080 Datasheet, PDF (23/38 Pages) Hynix Semiconductor – 8 Megabit (1M x 8), 5 Volt-only, Flash Memory

AC CHARACTERISTICS
Read Operations
Parameter
JEDEC Std
Description
Test Setup
t_AVAV
t_AVQV
t_ELQV
t_EHQZ
t_GLQV
t_GHQZ
t_RC Read Cycle Time (Note 1)
t_ACC Address to Output Delay
t_CE Chip Enable to Output Delay
t_DF Chip Enable to Output High Z (Note 1)
t_OE Output Enable to Output Delay
t_DF Output Enable to Output High Z (Note 1)
Read
t_OEH
Output Enable
Hold Time (Note 1)
Toggle and
Data# Polling
CE# = V_IL
OE# = V_IL
OE# = V_IL
CE# = V_IL
Min
Max
Max
Max
Max
Max
Min
Min
t_AXQX
t_OH
Output Hold Time from Addresses, CE#
or OE#, Whichever Occurs First (Note 1)
Min
Notes:
1. Not 100% tested.
2. See Figure 11 and Table 7 for test conditions.
Addresses
CE#
t_RC
Addresses Stable
t_ACC
HY29F080
Speed Option
Unit
- 70 - 90 - 12
70 90 120 ns
70 90 120 ns
70 90 120 ns
20 20 30 ns
30 35 50 ns
20 20 30 ns
0
ns
10
ns
0
ns
OE#
WE#
Outputs
t_OE
t_OEH
t_DF
t_CE
t_OH
Output Valid
RESET#
RY/BY#
0V
Figure 13. Read Operation Timings
Rev. 6.1/May 01
23