HY29F002T Datasheet, PDF (22/38 Pages) Hynix Semiconductor – 2 Megabit (256K x 8), 5 Volt-only, Flash Memory

HY29F002T
TEST CONDITIONS
+ 5V
DEVICE
UNDER
TEST
C_L
6.2
KOhm
2.7
KOhm
All diodes
are
1N3064
or
equivalent
Figure 11. Test Setup
Table 7. Test Specifications
Test
Condition
- 45
- 55
- 70
- 90
Unit
Output Load
1 TTL Gate
Output Load Capacitance (C_L) 30 100 pF
Input Rise and Fall Times
5 20 ns
Input Signal Low Level
0.0 0.45 V
Input Signal High Level
3.0 2.4 V
Low Timing Measurement
Signal Level
1.5 0.8 V
High Timing Measurement
Signal Level
1.5 2.0 V
3.0 V
0.0 V
Input 1.5 V
Measurement Level
HY29F002T-45, -55 Versions
1.5 V Output
2.4 V
0.45 V
Input
2.0 V
0.8 V
Measurement
Levels
2.0 V
0.8 V
HY29F002T-70, -90 Versions
Figure 12. Input Waveforms and Measurement Levels
Output
22
Rev. 4.1/May 01