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HY29F002T Datasheet, PDF (21/38 Pages) Hynix Semiconductor – 2 Megabit (256K x 8), 5 Volt-only, Flash Memory
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DC CHARACTERISTICS
HY29F002T
CMOS Compatible
Parameter
Description
Test Setup
Min
Typ
Max Unit
ILI
Input Load Current
ILIT
A[9], OE#, RESET# Input
Load Current 4
VIN = VSS to VCC,
VCC = VCC Max
VCC = VCC Max,
A[9] = OE# = 12.5V
RESET# = 12.5 V
±1.0
µA
50
µA
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC Max
ICC1
VCC Active Read Current 1, 3
CE# = VIL, OE# = VIH
ICC2
VCC Active Write Current 2, 3, 4 CE# = VIL, OE# = VIH
ICC3
VCC CE# Controlled
CMOS Standby Current 3
CE# = VCC ± 0.5V
RESET# = VCC ± 0.5V
ICC4
VCC RESET# Controlled
CMOS Standby Current 3
RESET# = VSS ± 0.5V
±1.0
µA
20
30
mA
30
40
mA
1
5
µA
1
5
µA
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Electronic ID and
Temporary Sector Unprotect
VCC = 5.0V
-0.5
0.7 x VCC
11.5
0.8
V
VCC + 0.3 V
12.5
V
VOL
Output Low Voltage
VCC = VCC Min,
IOL = 12.0ma
0.45
V
VOH
Output High Voltage
VCC = VCC Min,
IOH = -2.5 mA
VCC = VCC Min,
IOH = -100 µA
0.85 x
VCC
VCC - 0.4
V
V
VLKO
Low VCC Lockout Voltage 3
3.2
4.2
V
Notes:
1. Includes both the DC Operating Current and the frequency dependent component at 6 MHz. The read component of the
ICC current is typically less than 2 ma/MHz with OE# at VIH.
2. I active while Automatic Erase or Automatic Program algorithm is in progress.
CC
3. ICC max measured with VCC = VCC max.
4. Not 100% tested.
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Rev. 4.1/May 01
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
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