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HY29F040A Datasheet, PDF (18/40 Pages) Hynix Semiconductor – 512K x 8-bit CMOS 5.0 volt-only, Sector Erase Flash Memory
ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature
Plastic Package .............................. -65°C to + 125°C
Ambient Temperature
With Power Applied .......................... -55°C to + 125°C
Voltage with Respect to Ground
All pins except A9 (1) .......................... -2.0V to + 7.0V
Vcc(1) ............................................... -2.0V to + 7.0V
A9(2) ............................................... -2.0V to + 14.0V
Output Short Circuit Current(3) ......................... 200 mA
Commercial( C) Devices ..................... 0°C to + 70°C
Industrial (I) Devices ........................ -40°C to + 85°C
Extended (E) Devices ..................... -55°C to + 125°C
Vcc Supply Voltages .................................................
Vcc for HY29F040A-55 .................. + 4.75V to + 5.25V
Vcc for HY29F040A-70, -90, -120, -150
.......................................................... + 4.5V to + 5.5V
Notes:
1. Minimum DC voltage on input or I/O pins
is - 0.5V. During voltage transitions, inputs may
overshoot Vss to -2.0V for periods of up to 20 ns.
Maximum DC voltage on output and I/O pins is Vcc +
0.5V. During Voltage transitions, outputs may
overshoot to Vcc + 2.0V for periods up to 20 ns.
2. Minimum DC input voltage on A9 pin is -0.5V.
During voltage transitions, A9 may overshoot Vss
to -2.0V for periods of up to 20 ns. Maximum DC input
voltage on A9 is + 13.5V which may overshoot to 14.0V
for periods of up to 20 ns.
3. No more than one output shorted at a time. Duration
of the short circuit should not be greater than one
second.
Notes:
1. Operating ranges define those limits between which
the functionality of the device is guaranteed.
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied. Exposure of the device to absolute maxi-
mum rating conditions for extended periods may affect
device reliability.
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HY29F040A