M13S2561616A-2S Datasheet, PDF (10/49 Pages) Elite Semiconductor Memory Technology Inc. – Double-data-rate architecture, two data transfers per clock cycle

ESMT
M13S2561616A (2S)
Operation Temperature Condition -40°C~85°C
AC Timing Parameter & Specifications – continued
Parameter
Symbol
-5
min
max
-6
min
max
Unit Note
Active to Precharge command
Active to Active / Auto Refresh
command period
t_RAS
40
70K
42
70K ns
t_RC
55
60
ns
Auto Refresh to Active / Auto Refresh
command period
t_RFC
70
72
ns
Active to Read, Write delay
Precharge command period
Active to Read with Auto Precharge
command
t_RCD
15
t_RP
15
t_RAP
15
18
ns
18
ns
18
ns
Active bank A to Active bank B
command
t_RRD
10
12
ns
Write recovery time
t_WR
15
15
ns
Write data in to Read command delay
t_WTR
2
2
t_CK
Average periodic refresh interval
t_REFI
7.8
7.8
us
14
Write preamble
t_WPRE
0.25
0.25
t_CK
Write postamble
t_WPST
0.4
0.6
0.4
0.6
t_CK
12
Read preamble
t_RPRE
0.9
1.1
0.9
1.1
t_CK
Read postamble
t_RPST
0.4
0.6
0.4
0.6
t_CK
Clock to DQS write preamble setup time t_WPRES
0
0
ns
13
Mode Register Set command cycle time t_MRD
2
2
t_CK
Exit self refresh to Read command
t_XSRD
200
200
t_CK
Exit self refresh to non-Read command
Auto Precharge write
recovery+precharge time
t_XSNR
t_DAL
75
(t_WR/t_CK)
+
(t_RP/t_CK)
75
(t_WR/t_CK)
+
(t_RP/t_CK)
ns
t_CK
23
Notes:
1.
2.
3.
All voltages referenced to V_SS.
Tests for AC timing, IDD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply
voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified.
The below figure represents the timing reference load used in defining the relevant timing parameters of the part. It is
not intended to be either a precise representation of the typical system environment nor a depiction of the actual load
presented by a production tester. System designers will use IBIS or other simulation tools to correlate the timing
reference load to a system environment. Manufacturers will correlate to their production test conditions (generally a
coaxial transmission line terminated at the tester electronics).
Elite Semiconductor Memory Technology Inc.
Publication Date : Jan. 2015
Revision : 1.0
10/49