DDC232 Datasheet, PDF (2/28 Pages) Burr-Brown (TI) – 32-Channel, Current-Input Analog-to-Digital Converter

DDC232
SBAS331C – AUGUST 2004 – REVISED SEPTEMBER 2006
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
AVDD to AGND
DVDD to DGND
AGND to DGND
VREF Input to AGND
Analog Input to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature
Storage Temperature
Junction Temperature (T_J)
–0.3V to +6V
–0.3V to +3.6V
±0.2V
2.0V to AVDD + 0.3V
–0.3V to +0.7V
–0.3V to DVDD + 0.3V
–0.3V to AVDD + 0.3V
0°C to +70°C
–60°C to +150°C
+150°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
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