W28F641B Datasheet, PDF (17/31 Pages) Winbond – 64MBIT (4MBIT × 16) PAGE MODE DUAL WORK FLASH MEMORY

W28F641B/T
Capacitance⁽¹⁾
TA = +25° C, f = 1 MHz
PARAMETER
Input Capacitance
Output Capacitance
Note: Sampled, not 100% tested.
SYM.
CIN
COUT
AC Input/Output Test Conditions
TYP.
6
10
MAX.
8
12
UNIT
pF
pF
CONDITION
VIN = 0.0V
VOUT = 0.0V
VDDQ
0.0
INPUT
VDDQ/2
TEST POINTS
VDDQ/2 ^OUTPUT
AC test inputs are driven at VDDQ(min) for a Logic "1" and 0.0V for a Logic "0".
Input timing begins, and output timing ends at VDDQ/2. Input rise and fall times (10% to 90%) < 5 nS.
Worst case speed conditions are when VDD = VDD(min).
Figure 5. Transient Input/Output Reference Waveform for VDD = 2.7V to 3.6V
VDDQ(min)/2
1N914
R L =3.3K ohm
DEVICE
UNDER
TEST
C L _{Includes Jig Capacitance}
C_L
OUT
Figure 6. Transient Equivalent Testing Load Circuit
Table 13. Configuration Capacitance Loading Value
TEST CONFIGURATION
V_DD = 2.7V to 3.6V
CL(PF)
50
- 17 -
Publication Release Date: March 27, 2003
Revision A3