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VS-GA100TS120UPBF Datasheet, PDF (6/10 Pages) Vishay Siliconix – Very low conduction and switching losses
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VS-GA100TS120UPbF
Vishay Semiconductors
240
VR = 720 V
TJ = 125 °C
TJ = 25 °C
200
IF = 200 A
IF = 100 A
IF = 50 A
160
120
80
400
800
1200
1600
2000
dIF/dt (A/µs)
Fig. 15 - Typical Reverse Recovery Time vs. dIF/dt
L2
L1
RG2
L
+
- VCC
-
+
RG1
RG2
+ VG2
- VG2
RG1
L3
VCC = 60 % of BVCES
LS = L1 + L2 + L3
VGE = ± 15 V
Fig. 17a - Test Circuit for Measurement of ILM, Eon, Eoff(diode), trr, Qrr,
Irr, td(on), tr, td(off), tf
+ VGE
IC 10 % VCE
td(off)
90 % VGE
VCE
90 % IC
IC
5 % IC
tf
t1 + 5 µs
∫ Eoff = VVcCeEicICdtdt
t1
t1
t2
Fig. 17b - Test Waveforms for Circuit of Fig. 18a,
Defining Eoff, td(off), tf
250
200
IF = 200 A
IF = 100 A
IF = 50 A
150
100
50
0
400
VR = 720 V
TJ = 125 °C
TJ = 25 °C
800
1200
1600
2000
dIF/dt (A/µs)
Fig. 16 - Typical Recovery Current vs. dIF/dt
10 % + VG
Gate voltage D.U.T.
+ VG
VCE
VCC 10 % IC
90 % IC
td(on)
5 % VCE
tr
t1
D.U.T. voltage
and current
Ipk
IC
t2
∫ Eon = VCE IC dt
t1
t2
Fig. 17c - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr
IC
trr
tx
10 % VCC
Vpk
Irr
∫ trr
Qrr = iIdC ddtt
tx
10 % Irr
VCC
Diode recovery
waveforms
Diode reverse
recovery energy
t3
t4
∫ Erec = VD IC dt
t3
t4
Fig. 17d - Test Waveforms for Circuit of Fig. 18a,
Defining Erec, trr, Qrr, Irr
Revision: 26-Mar-12
6
Document Number: 94428
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