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SSM6L13TU_10 Datasheet, PDF (3/8 Pages) Toshiba Semiconductor – TOSHIBA Field-Effect Transistor Silicon P / N Channel MOS Type
Q1 Switching Time Test Circuit
(a) Test Circuit
2.5 V
IN
0
10 μs
VDD = 10 V
RG = 4.7 Ω
Duty ≤ 1%
VIN: tr, tf < 5 ns
Common Source
Ta = 25 °C
OUT
VDD
Q2 Switching Time Test Circuit
(a) Test Circuit
0
IN
− 2.5 V
10 μs
VDD = - 10 V
RG = 4.7 Ω
Duty ≤ 1 %
VIN: tr, tf < 5 ns
Common Source
Ta = 25 °C
OUT
RL
VDD
SSM6L13TU
(b) VIN
(c) VOUT
2.5 V
0V
VDD
VDS (ON)
10 %
90 %
90 %
10 %
tr
tf
ton
toff
(b) VIN
0V
(c) VOUT
−2.5 V
VDS (ON)
VDD
90 %
10 %
90 %
10 %
tr
tf
ton
toff
Q1 Precaution
Vth can be expressed as the voltage between gate and source when the low operating current value is ID= 1 mA for
this product. For normal switching operation, VGS (on) requires a higher voltage than Vth, and VGS (off) requires a lower
voltage than Vth.
(The relationship can be established as follows: VGS (off) < Vth < VGS (on). )
Take this into consideration when using the device.
Q2 Precaution
Vth can be expressed as the voltage between gate and source when the low operating current value is ID= − 1 mA for
this product. For normal switching operation, VGS (on) requires a higher voltage than Vth, and VGS (off) requires a lower
voltage than Vth.
(The relationship can be established as follows: VGS (off) < Vth < VGS (on). )
Take this into consideration when using the device.
Handling Precaution
When handling individual devices that are not yet mounted on a circuit board, make sure that the environment is
protected against electrostatic discharge. Operators should wear antistatic clothing, and containers and other objects that
come into direct contact with devices should be made of antistatic materials.
Thermal resistance Rth (ch-a) and Power dissipation PD vary depending on board material, board area, board thickness
and pad area. When using this device, please take heat dissipation into consideration.
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2010-07-10