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DS99R124AQ_14 Datasheet, PDF (5/31 Pages) Texas Instruments – 5 - 43 MHz 18-bit Color FPD-Link II to FPD-Link Converter
DS99R124AQ
www.ti.com
SNLS342A – JULY 2011 – REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings(1)(2)
Supply Voltage – VDDn (1.8V)
Supply Voltage – VDDTX (3.3V)
Supply Voltage – VDDIO
LVCMOS I/O Voltage
Receiver Input Voltage
LVDS Output Voltage
Junction Temperature
Storage Temperature
Lead Temperature (Soldering, 4s)
48L WQFN Package
Maximum Power Dissipation Capacity at 25°C
ESD Rating (IEC, powered-up only), RD =
330Ω, CS = 150pF
ESD Rating (ISO10605), RD = 330Ω, CS = 150
and 330pF
ESD Rating (ISO10605), RD = 2kΩ, CS = 150
and 330pF
ESD Rating (HBM)
ESD Rating (CDM)
ESD Rating (MM)
Derate above 25°C
θJA
θJC
Air Discharge (RIN+, RIN−)
Contact Discharge (RIN+, RIN−)
Air Discharge (RIN+, RIN−)
Contact Discharge (RIN+, RIN−)
Air Discharge (RIN+, RIN−)
Contact Discharge (RIN+, RIN−)
−0.3V to +2.5V
−0.3V to +4.0V
−0.3V to +4.0V
−0.3V to +(VDDIO + 0.3V)
−0.3V to (VDD + 0.3V)
−0.3V to (VDDTX + 0.3V)
+150°C
−65°C to +150°C
+260°C
1/ θJA°C/W
27.7 °C/W
3.0 °C/W
≥±30 kV
≥±6 kV
≥±15 kV
≥±8 kV
≥±15 kV
≥±8 kV
≥±8 kV
≥±1.25 kV
≥±250 V
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
Recommended Operating Conditions
Min Nom Max Units
Supply Voltage (VDDn)
LVCMOS Supply Voltage (VDDIO)
LVCMOS Supply Voltage (VDDIO)
Operating Free Air Temperature (TA)
TxCLK Clock Frequency
Supply Noise(1)
1.71
1.8
1.89
V
1.71
1.8
1.89
V
3.0
3.3
3.6
V
−40
+25 +105
°C
5
43
MHz
100
mVP-P
(1) Supply noise testing was done with minimum capacitors on the PCB. A sinusoidal signal is AC coupled to the VDDn (1.8V) supply with
amplitude = 100 mVp-p measured at the device VDDn pins. Bit error rate testing of input to the Ser and output of the Des with 10 meter
cable shows no error when the noise frequency on the Ser is less than 750 kHz. The Des on the other hand shows no error when the
noise frequency is less than 400 kHz.
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