TCA9539_15 Datasheet, PDF (4/42 Pages) Texas Instruments – Low Voltage 16-Bit I2C and SMBus Low-Power I/O Expander

TCA9539
SCPS202B – OCTOBER 2009 – REVISED OCTOBER 2015
www.ti.com
NAME
P15
P16
P17
A0
SCL
SDA
V_CC
NO.
TSSOP
(PW)
QFN
(RTW, RGE)
18
15
19
16
20
17
21
18
22
19
23
20
24
21
Pin Functions (continued)
I/O
DESCRIPTION
I/O
P-port input/output. Push-pull design structure. At power on, P15 is
configured as an input.
I/O
P-port input/output. Push-pull design structure. At power on, P16 is
configured as an input.
I/O
P-port input/output. Push-pull design structure. At power on, P17 is
configured as an input.
I
Address input. Connect directly to V_CC or ground.
I
Serial clock bus. Connect to V_CC through a pullup resistor.
I/O
Serial data bus. Connect to V_CC through a pullup resistor.
—
Supply voltage
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) ⁽¹⁾
MIN
MAX
UNIT
V_CC
Supply voltage range
V_I
Input voltage range ⁽²⁾
V_O
Output voltage range ⁽²⁾
I_IK
Input clamp current
I_OK
Output clamp current
I_IOK
Input/output clamp current
I_OL
Continuous output low current
I_OH
Continuous output high current
Continuous current through GND
I_CC
Continuous current through V_CC
T_stg
Storage temperature
V_I < 0
V_O < 0
V_O < 0 or V_O > V_CC
V_O = 0 to V_CC
V_O = 0 to V_CC
–0.5
6
V
–0.5
6
V
–0.5
6
V
–20
mA
–20
mA
±20
mA
50
mA
–50
mA
–250
mA
160
–65
150
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
6.2 ESD Ratings
V_(ESD) Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 ⁽¹⁾
Charged-device model (CDM), per JEDEC specification JESD22-C101
(2)
VALUE
±2000
±1000
UNIT
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 500-V HBM is possible with the necessary precautions.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 250-V CDM is possible with the necessary precautions.
4
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