THS1007_14 Datasheet, PDF (22/34 Pages) Texas Instruments – 10-BIT, 4 ANALOG INPUT, 6-MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER

THS1007
SLAS286B − AUGUST 2000− REVISED DECEMBER 2010
ADC CONTROL REGISTERS
Control Register 0, Write Only (see Table 7)
BIT 11 BIT 10
0
0
BIT 9
TEST1
BIT 8
TEST0
BIT 7
SCAN
BIT 6
DIFF1
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BIT 5
DIFF0
BIT 4
CHSEL1
BIT 3
CHSEL0
BIT 2
PD
BIT 1
RES
BIT 0
VREF
Table 8. Control Register 0 Bit Functions
BITS
0
1
2
3, 4
5,6
7
8,9
RESET
VALUE
0
0
0
0,0
1,0
0
0,0
NAME
FUNCTION
VREF
Vref select:
Bit 0 = 0 → The internal reference is selected
Bit 0 = 1 → The external reference voltage is used for the ADC
RES
RESERVED
PD
Power down.
Bit 2 = 0 → The ADC is active
Bit 2 = 1 → Power down
The reading and writing to and from the digital outputs is possible during power down.
CHSEL0,
CHSEL1
Channel select
Bit 3 and bit 4 select the analog input channel of the ADC. Refer to Table 9.
DIFF0, DIFF1 Number of differential channels
Bit 5 and bit 6 contain information about the number of selected differential channels. Refer to Table 9.
SCAN
Autoscan enable
Bit 7 enables or disables the autoscan function of the ADC. Refer to Table 9.
TEST0,
TEST1
Test input enable
Bit 8 and bit 9 control the test function of the ADC. Three different test voltages can be measured. This
feedback allows the check of all hardware connections and the ADC operation.
Refer to Table 10 for selection of the three different test voltages.
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