BQ29312_15 Datasheet, PDF (2/39 Pages) Texas Instruments – FOUR CELL LITHIUM-ION

bq29312
SLUS546E – MARCH 2003 – REVISED MARCH 2005
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device
placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (Continued)
The communications interface allows the host to observe and control the current status of the bq29312. It
enables cell balancing, enters different power modes, sets overload levels, sets the overload blanking delay time,
sets short-circuit threshold levels for charge and discharge, and sets the short-circuit blanking delay time.
Cell balancing of each cell is performed via a cell bypass path, which is enabled via the internal control register
accessible via the I²C compatible interface. The maximum bypass current is set via an external series resistor
and internal FET on resistance (typical 400 Ω).
ORDERING INFORMATION
PACKAGED ⁽¹⁾
T_A
TSSOP (PW)
–25°C to 85°C
bq29312PW
bq29312PWR
(1) For the most current package and ordering information, see the Package Option Addendum at the
end of this document, or see the TI website at www.ti.com.
PACKAGE DISSIPATION RATINGS
PACKAGE
PW
POWER RATING
T_A ≤ 25°C
874 mW
DERATING FACTOR
ABOVE T_A ≤ 25°C
6.99 W/°C
POWER RATING
T_A ≤ 70°C
559 mW
T_A = 85°C
454 mW
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted⁽¹⁾⁽²⁾
bq29312
V_SS
Supply voltage range
PACK, BAT
VC1, VC2, VC3, VC4
–0.3 V to 34 V
–0.3 V to 34 V
SR1, SR2
–1.0 V to 1.0 V
V_I
Input voltage range
VC5
VC1 to VC2, VC2 to VC3, VC3 to VC4, VC4 to
VC5
–1.0 V to 4.0 V
–0.3 to 8.5 V
WDI, SLEEP, SCLK, SDATA
–0.3 to 8.5 V
ZVCHG
–0.3 V to 34 V
DSG, CHG
–0.3 V to BAT
V_O
Output voltage range
OD
PMS
–0.3 V to 34 V
–0.3 V to PACK – 0.2 V
TOUT, SCLK, SDATA, CELL, XALERT
–0.3 to 7 V
Current for cell balancing
10 mA
Continuous total power dissipation
See Dissipation Rating Table
T_stg
Storage temperature range
Lead temperature (soldering, 10 sec)
–65°C to 150°C
300°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to ground of this device except VCn – VC(n + 1), where n = 1, 2, 3, 4 cell voltage.
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