ADS1291_14 Datasheet, PDF (2/75 Pages) Texas Instruments – Power, 2-Channel, 24-Bit Analog Front-End for Biopotential Measurements

ADS1291
ADS1292
ADS1292R
SBAS502B – DECEMBER 2011 – REVISED SEPTEMBER 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
ADS1291I
ADS1292I
ADS1292RI
PACKAGE
OPTION
TQFP
QFN
TQFP
QFN
TQFP
QFN
FAMILY AND ORDERING INFORMATION⁽¹⁾
PACKAGE
DESIGNATOR
NUMBER OF
CHANNELS
ADC
RESOLUTION
MAXIMUM
SAMPLE
RATE (kSPS)
PBS
1
24
8
RSM
1
24
8
PBS
2
24
8
RSM
2
24
8
PBS
2
24
8
RSM
2
24
8
OPERATING
TEMPERATUR RESPIRATION
E RANGE
CIRCUITRY
–40°C to +85°C
No
–40°C to +85°C
No
–40°C to +85°C
No
–40°C to +85°C
No
–40°C to +85°C
Yes
–40°C to +85°C
Yes
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range, unless otherwise noted.
AVDD to AVSS
DVDD to DGND
AVSS to DGND
Analog input to AVSS
Digital input to DVDD
Input current to any pin except supply pins
Input current
Momentary
Continuous
Operating temperature range
Storage temperature range
Maximum junction temperature (T_J)
ESD ratings
Human body model (HBM)
JEDEC standard 22, test method A114-C.01, all pins
Charged device model (CDM)
JEDEC standard 22, test method C101, all pins
VALUE
–0.3 to +5.5
–0.3 to +3.9
–3 to +0.2
AVSS – 0.3 to AVDD + 0.3
DVSS – 0.3 to DVDD + 0.3
±10
±100
±10
–40 to +85
–60 to +150
+150
±1000
±500
UNIT
V
V
V
V
V
mA
mA
mA
°C
°C
°C
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
Submit Documentation Feedback
Copyright © 2011–2012, Texas Instruments Incorporated
Product Folder Links: ADS1291 ADS1292 ADS1292R