TIBPSG507AC Datasheet, PDF (11/19 Pages) Texas Instruments – 13 × 80 × 8 PROGRAMMABLE SEQUENCE GENERATOR

TIBPSG507AC
13 × 80 × 8 PROGRAMMABLE SEQUENCE GENERATOR
SRPS002D – D3029, MAY 1987 – REVISED NOVEMBER 1995
diagnostics
A diagnostic mode is provided that allows the user to inspect the contents of the state registers. The following
are step-by-step procedures required for the diagnostics.
Step 1.
Step 2.
Step 3.
Disable all outputs by taking pin 17 (OE) high (see Note 5).
Take pin 8 (Q0) to V_IHH to enable the diagnostics test sequence.
Apply appropriate levels of voltage to pins 11 (Q3), 13 (Q4), and 14 (Q5) to select the desired
state register (see Table 1).
The voltage level monitored on pin 9 will indicate the state of the selected state register.
NOTE 5: If pin 17 is being used as an input to the array, then pin 7 (I5) must be taken to VIHH before pin 17 is taken high.
I5
Pin 7
OE
Pin 17
Q0
Pin 8
100 ns
Q3, Q4, Q5
Pins 11, 13, 14
Q1
Pin 9
† _{VIHH = 10.25 V min, 10.5 V nom, 10.75 V max}
100 ns
100 ns
VIHH†
VIH
VOHH
VOH
VOL
VOHH
VOH
VOL
VOH
VOL
Figure 2. Diagnostics Waveforms
Table 1. Addressing State Registers
During Diagnostics
REGISTER BINARY ADDRESS
PIN 11
PIN13
PIN 14
L
L
L
L
L
H
L
L
HH
L
H
L
L
H
H
L
H
HH
L
HH
L
L
HH
H
L
HH
HH
H
L
L
H
L
H
H
L
HH
H
H
L
H
H
H
H
H
HH
H
HH
L
H
HH
H
H
HH
HH
BURIED REGISTER
SELECTED
SCLR0
SCLR1
CNT/HLD0
CNT/HLD1
P0
P1
P2
P3
P4
P5
P6
P7
C0
C1
C2
C3
C4
C5
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