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DS90C032B Datasheet, PDF (1/16 Pages) National Semiconductor (TI) – LVDS Quad CMOS Differential Line Receiver
DS90C032B
www.ti.com
SNLS052C – MARCH 1999 – REVISED APRIL 2013
DS90C032B LVDS Quad CMOS Differential Line Receiver
Check for Samples: DS90C032B
FEATURES
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•2 >155.5 Mbps (77.7 MHz) Switching Rates
• Accepts Small Swing (350 mV) Differential
Signal Levels
• High Impedance LVDS Inputs with Power
Down
• Ultra Low Power Dissipation
• 600 ps Maximum Differential Skew (5V, 25°C)
• 6.0 ns Maximum Propagation Delay
• Industrial Operating Temperature Range
• Available in Surface Mount Packaging (SOIC)
• Pin Compatible with DS26C32A, MB570 (PECL)
and 41LF (PECL)
• Supports OPEN and Terminated Input Failsafe
• Conforms to ANSI/TIA/EIA-644 LVDS Standard
DESCRIPTION
The DS90C032B is a quad CMOS differential line
receiver designed for applications requiring ultra low
power dissipation and high data rates. The device
supports data rates in excess of 155.5 Mbps
(77.7 MHz) and uses Low Voltage Differential
Signaling (LVDS) technology.
The DS90C032B accepts low voltage (350 mV)
differential input signals and translates them to
CMOS (TTL compatible) output levels. The receiver
supports a TRI-STATE function that may be used to
multiplex outputs. The receiver also supports OPEN
Failsafe and terminated (100Ω) input Failsafe with the
addition of external failsafe biasing. Receiver output
will be HIGH for both Failsafe conditions.
The DS90C032B provides power-off high impedance
LVDS inputs. This feature assures minimal loading
effect on the LVDS bus lines when VCC is not
present.
The DS90C032B and companion line driver
(DS90C031B) provide a new alternative to high
power pseudo-ECL devices for high-speed point-to-
point interface applications.
Connection Diagram
Functional Diagram
Figure 1. Dual-In-Line Top View
See Package Number D (R-PDSO-G16)
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2013, Texas Instruments Incorporated