THS1206 Datasheet, PDF (6/41 Pages) Texas Instruments – 12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS

THS1206
12-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTERS
SLAS217D – MAY 1999 – REVISED APRIL 2000
electrical characteristics over recommended operating conditions, V_REF = internal (unless
otherwise noted) (continued)
dc specifications
PARAMETER
Resolution
Accuracy
Integral nonlinearity, INL
Differential nonlinearity, DNL
Offset error
Gain error
Analog input
Input capacitance
Input leakage current
Internal voltage reference
Accuracy, VREFP
Accuracy, VREFM
Temperature coefficient
Reference noise
Accuracy, REFOUT
Power supply
IDDA Analog supply current
IDDD Digital supply voltage
IDDB Buffer supply voltage
IDD_P Supply current in power-down mode
Power dissipation
Power dissipation in power down
† _{Not production tested for M and Q suffix devices.}
TEST CONDITIONS
MIN TYP MAX UNIT
12
Bits
C and I suffix
Q and M suffix
After calibration in single-ended mode
After calibration in differential mode
–15†
–5†
±1.5
LSB
±1.8
±1 LSB
15† mV
5† mV
1% FSR
VAIN = VREFM to VREFP
C and I suffix
Q and M suffix
C and I suffix
Q and M suffix
C and I suffix
Q and M suffix
15
pF
±10 µA
3.33
3.3
1.42
1.3
2.475
2.3
3.5 3.67
V
3.5 3.7
1.5 1.58
V
1.5 1.7
50
PPM/°C
100
µV
2.5 2.525
V
2.5 2.7
AVDD =5 V, BVDD = DVDD = 3.3 V
AVDD = 5 V, BVDD = DVDD = 3.3 V
AVDD = 5 V, BVDD = DVDD = 3.3 V
AVDD = 5 V,
BVDD = DVDD = 3.3 V
C and I suffix
Q and M suffix
AVDD = 5 V, DVDD = BVDD = 3.3 V
AVDD = 5 V, DVDD = BVDD = 3.3 V
36
40 mA
0.5
1 mA
1.5
4 mA
7
mA
10
186 216 mW
30
mW
6
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