THS1206 Datasheet, PDF (20/41 Pages) Texas Instruments – 12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS

THS1206
12-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTERS
SLAS217D – MAY 1999 – REVISED APRIL 2000
analog input channel selection (continued)
test mode
The test mode of the ADC is selected via bit 8 and bit 9 of control register 0. The different selections are shown
in Table 11.
Table 11. Test Mode
BIT 9
TEST1
0
0
1
1
BIT 8
TEST0
0
1
0
1
OUTPUT RESULT
Normal mode
VREFP
((VREFM)+(VREFP))/2
VREFM
Three different options can be selected. This feature allows support testing of hardware connections between
the ADC and the processor.
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